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Ellipsometry and Polarized Light R M A Azzam, N M Bashara
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Bashara: Ellipsometry and Polarized Light (North-Holland, Amsterdam, 1977) Chap. The ellipsometer uses the changes in polarization of circularly polarized light in specular reflection to determine optical properties of materials and film thicknesses. Section I is devoted to a short and pedagogical introduction of the formalisms used to describe light polarization. When analyzing the polarization of light, ellipsometry provides information about layers that are much thinner than probing light's wavelength. The main advantage of spectroscopic reflectometry is its low-cost and simplicity. Bashara: Ellipsometry And Polarized Light (North-Holland, Amsterdam, 1977). The following section is devoted to standard ellipsometry. That uses the polarization properties of light to measure the phase retardation induced by the birefringence of the RNFL.4 This method is essentially based on a confocal scanning laser ophthalmoscope with an integrated ellipsometer. Bashara: Ellipsometry and Polarized Light (North-Holland, Amsterdam, 1987) 2nd ed., Chap. Ellipsometry is an optical procedure that measures the change in polarization state of a beam of light after it is reflected off of (or transmitted through) a sample. Electromagnetic waves, such as light, and gravitational waves exhibit polarization; acoustic waves (sound waves) in a gas or liquid do not have polarization because the direction of vibration and direction of propagation are the same. Theory of Ellipsometry 1 Polarized Light and EllipsometryJosef Humlíc ˇek Institute of Condensed Matter Physics, Faculty of Science Masaryk University Brno, Czech RepublicPolarization is a fundamental property of light. Non-polarized light is used at normal incidence. Spectroscopic ellipsometers can analyze multi-layer films or other complexly structured thin films because they can measure the polarized light condition of thin films in certain wavelength bands. Ellipsometry and Polarized Light, R.